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Ultramicroscopy|February 4, 2026
Temperature distributions in MEMS microheaters during gas phase experiments in an environmental TEMAmit Kumar, Zhongtao Ma, Julian Taubmann, et al.Ultramicroscopy|February 11, 2026
Drift correction methods for multi-pass 4D-STEMAli Mostaed, Chen Huang, Amirafshar Moshtaghpour, et al.Ultramicroscopy|June 17, 2025
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensorsAimo Winkelmann, Grzegorz Cios, Konrad Perzyński, et al.Ultramicroscopy|June 17, 2025
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopyE I Rau, S V ZaitsevUltramicroscopy|June 13, 2025
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubesPaweł Urbański, Piotr Szyszka, Tomasz GrzebykUltramicroscopy|April 8, 2025
A novel method for through-silicon via characterization based on diffraction fringe analysisPengfei Lin, Kuan Lu, ChaBum LeeUltramicroscopy|April 23, 2025
Opportunities and challenges to determine surface free energy of chocolates on microscopic scale from atomic force microscopy adhesion measurementsSarah Schroeder, Koen Dewettinck, Volker Heinz, et al.Ultramicroscopy|June 17, 2023
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual latticeN Cherkashin, A Louiset, A Chmielewski, et al.Ultramicroscopy|March 15, 2026
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategyZixuan Zhang, Kai Wu, Chuanhong JinUltramicroscopy|February 26, 2026
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse dataBowen Liu, Zheng Hu, Walter van Bodegom, et al.Pageof 460