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Ultramicroscopy|February 4, 2019
Temporal magnification for streaked ultrafast electron diffraction and microscopyD Cesar, P MusumeciUltramicroscopy|February 4, 2019
Atomic force microscopy study of EDTA induced desorption of metal ions immobilized DNA from mica surfaceTao Yang, Hongyun GaoUltramicroscopy|November 23, 2019
Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscopeYoichiro Hashimoto, Shuichi Takeuchi, Takeshi Sunaoshi, et al.Ultramicroscopy|December 8, 2019
Quantifying oxygen distortions in lithium-rich transition-metal-oxide cathodes using ABF STEME Liberti, J G Lozano, M A Pérez Osorio, et al.Ultramicroscopy|February 7, 2020
Nanoimmunosensor based on atomic force spectroscopy to detect anti-myelin basic protein related to early-stage multiple sclerosisPâmela Soto Garcia, Doralina Guimarães Brum, Osvaldo N Oliveira, et al.Ultramicroscopy|February 12, 2020
Selective growth of platinum nanolines by helium ion beam induced deposition and atomic layer depositionPo-Shuan Yang, Zheng-da Huang, Kuei-Wen Huang, et al.Ultramicroscopy|February 12, 2020
Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materialsOndrej Dyck, Stephen Jesse, Niklas Delby, et al.Ultramicroscopy|January 10, 2020
Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurationsHan Han, Thomas Hantschel, Libor Strakos, et al.Ultramicroscopy|January 11, 2020
High order aberrations calculations of Wien filters using differential algebra methodsYongfeng Kang, Hangfeng Hu, Jingyi ZhaoUltramicroscopy|January 11, 2020
Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reductionT J Ruggles, Y S J Yoo, B E Dunlap, et al.Pageof 460