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Ultramicroscopy|August 6, 2005
Development of a shear force scanning near-field fluorescence microscope for biological applicationsG Y Shang, W H Qiao, F H Lei, et al.
Ultramicroscopy|July 6, 2005
Nonlinear imaging using annular dark field TEMS Bals, R Kilaas, C Kisielowski
Ultramicroscopy|June 21, 2005
Chemical analysis of nanometric dielectric layers using spatially resolved VEELSS Pokrant, M Cheynet, S Jullian, et al.
Ultramicroscopy|August 13, 2005
Nanotribological characterization of human hair and skin using atomic force microscopyCarmen LaTorre, Bharat Bhushan
Ultramicroscopy|May 9, 2007
Anomalous high-frequency oscillations in a field emission tube and their significance in pulsed field emissionM J Hagmann, D A Christensen, M S Mousa, et al.
Ultramicroscopy|June 8, 2022
Atomic layer deposited Al2O3 as a protective overlayer for focused ion beam preparation of plan-view STEM samplesJoseph M Gurrentz, Karalee A Jarvis, Ioana R Gearba-Dolocan, et al.
Ultramicroscopy|December 23, 2022
New probes based on carbon nano-cones for scanning probe microscopiesRobin Cours, Germercy Paredes, Aurélien Masseboeuf, et al.
Ultramicroscopy|July 3, 2021
Extraction of acceptor concentration map from EBIC experimentsO Marcelot, P Magnan
Ultramicroscopy|June 13, 2021
Resolution of non-destructive imaging by controlled acceleration voltage in scanning electron microscopyKelvin Elphick, Bernardus D Aditya, Jiaqi Wu, et al.
Ultramicroscopy|July 23, 2021
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopyKevin M Roccapriore, Nicole Creange, Maxim Ziatdinov, et al.
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