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Ultramicroscopy|May 28, 2018
Stable contrast mode on TiO2(110) surface with metal-coated tips using AFMYan Jun Li, Huanfei Wen, Quanzhen Zhang, et al.Ultramicroscopy|July 10, 2017
3D reconstruction of the magnetic vector potential using model based iterative reconstructionK C Prabhat, K Aditya Mohan, Charudatta Phatak, et al.Ultramicroscopy|July 11, 2017
Contrast enhancement of nanomaterials using phase plate STEMHiroki Minoda, Takayuki Tamai, Yuya Ohmori, et al.Ultramicroscopy|April 24, 2018
Entanglement and decoherence in electron microscopyP Schattschneider, S LöfflerUltramicroscopy|April 25, 2018
A continuous control mode with improved imaging rate for scanning ion conductance microscope (SICM)Jian Zhuang, Yangbohan Jiao, Zeqing Li, et al.Ultramicroscopy|April 13, 2018
In lens BSE detector with energy filteringTomáš Radlička, Marek Unčovský, Martin OralUltramicroscopy|April 29, 2018
Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved couplingYushu Shi, Wei Li, Sitian Gao, et al.Ultramicroscopy|April 4, 2018
On the detection of multiple events in atom probe tomographyZirong Peng, Francois Vurpillot, Pyuck-Pa Choi, et al.Ultramicroscopy|April 8, 2018
Advanced concentration analysis of atom probe tomography data: Local proximity histograms and pseudo-2D concentration mapsPeter Felfer, Julie CairneyUltramicroscopy|April 8, 2018
Exploring possibilities of band gap measurement with off-axis EELS in TEMSvetlana Korneychuk, Bart Partoens, Giulio Guzzinati, et al.Pageof 460