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Ultramicroscopy|February 19, 2018
Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation eventsE Di Russo, I Blum, J Houard, et al.Ultramicroscopy|July 17, 2017
Unmixing hyperspectral data by using signal subspace samplingJakob Spiegelberg, Shunsuke Muto, Masahiro Ohtsuka, et al.Ultramicroscopy|July 18, 2017
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitorLei Yu, Haibo Li, Weishi Wan, et al.Ultramicroscopy|November 5, 2017
Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopyJ F M van Rens, W Verhoeven, J G H Franssen, et al.Ultramicroscopy|November 22, 2017
In-situ elastic strain mapping during micromechanical testing using EBSDMark J McLean, William A OsbornUltramicroscopy|January 22, 2023
Automated classification of nanoparticles with various ultrastructures and sizes via deep learningClaudius Zelenka, Marius Kamp, Kolja Strohm, et al.Ultramicroscopy|January 23, 2023
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering modelsPaul S Minson, Felipe Rivera, Richard VanfleetUltramicroscopy|January 19, 2023
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopyAlex Oster, Helmut KohlUltramicroscopy|January 5, 2002
Fundamental new results in the energetics and thermodynamics of charged metal surfacesR G ForbesUltramicroscopy|January 5, 2002
Microfabrication and characterization of gated amorphous diamond-based field emission electron sourcesN S Xu, J C She, S E Huq, et al.Pageof 460