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Ultramicroscopy|September 10, 2013
Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopyM Moertelmaier, H P Huber, C Rankl, et al.Ultramicroscopy|September 10, 2013
Effective temperature of an ultracold electron source based on near-threshold photoionizationW J Engelen, E P Smakman, D J Bakker, et al.Ultramicroscopy|September 11, 2013
Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessmentT B Britton, J Jiang, R Clough, et al.Ultramicroscopy|May 4, 2013
Imaging spin filter for electrons based on specular reflection from iridium (001)D Kutnyakhov, P Lushchyk, A Fognini, et al.Ultramicroscopy|July 23, 2014
Quantitative analysis of carbon in cementite using pulsed laser atom probeH S Kitaguchi, S Lozano-Perez, M P MoodyUltramicroscopy|July 26, 2014
Atmospheric scanning electron microscope system with an open sample chamber: configuration and applicationsHidetoshi Nishiyama, Mitsuru Koizumi, Koji Ogawa, et al.Ultramicroscopy|November 30, 2013
Immobilizing live Escherichia coli for AFM studies of surface dynamicsN E Lonergan, L D Britt, C J SullivanUltramicroscopy|December 15, 2012
Point process statistics in atom probe tomographyT Philippe, S Duguay, G Grancher, et al.Ultramicroscopy|December 15, 2012
Parameter-free extraction of EMCD from an energy-filtered diffraction datacube using multivariate curve resolutionS Muto, K Tatsumi, J RuszUltramicroscopy|January 9, 2013
Reduction of multiple hits in atom probe tomographyMattias Thuvander, Anders Kvist, Lars J S Johnson, et al.Pageof 460