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Ultramicroscopy|January 14, 2003
Particle finding in electron micrographs using a fast local correlation algorithmAlan M RosemanUltramicroscopy|January 14, 2003
Lattice parameters from direct-space images at two tiltsW Qin, P FraundorfUltramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C JoyUltramicroscopy|January 14, 2003
Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscopeS T Huntington, P G Hartley, J KatsifolisUltramicroscopy|January 14, 2003
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beamW McBride, D J H Cockayne, K TsudaUltramicroscopy|January 1, 1987
Angular reconstitution: a posteriori assignment of projection directions for 3D reconstructionM Van HeelUltramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M MalacUltramicroscopy|July 26, 2002
Field evaporation behaviour in the gamma phase in Ti-Al during analysis in the tomographic atom probeW Lefebvre, A Loiseau, A MenandUltramicroscopy|December 31, 2002
Reconstruction of composite in-line electron holograms using a small emission coneRoman Holenstein, Timothy A Rothwell, Mark R A ShegelskiUltramicroscopy|December 31, 2002
Apertureless near-field optical microscopy of metallic nanoparticlesA Pack, W Grill, R WannemacherPageof 460