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Ultramicroscopy|July 13, 2007
New approach for the dynamical simulation of CBED patterns in heavily strained specimensF Houdellier, A Altibelli, C Roucau, et al.
Ultramicroscopy|January 31, 2007
Simulation of partially coherent image formation in a compact soft X-ray microscopeOlov von Hofsten, Per A C Takman, Ulrich Vogt
Ultramicroscopy|September 19, 2006
Quantification and thickness correction of EFTEM phosphorus mapsM A Aronova, Y C Kim, G Zhang, et al.
Ultramicroscopy|April 4, 2007
Effects of 10 MeV electron irradiation at high temperature of a Ni-Mo-based HastelloyN Wanderka, A Bakai, C Abromeit, et al.
Ultramicroscopy|April 4, 2007
Atom probe specimen preparation with a dual beam SEM/FIB millerM K Miller, K F Russell
Ultramicroscopy|April 21, 2007
New tomographic atom probe at University of Muenster, GermanyP Stender, C Oberdorfer, M Artmeier, et al.
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