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Ultramicroscopy

Showing results (351-360 of 4,742) with videos related to

Pageof 475
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Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Ultramicroscopy|January 14, 2003
Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscopeS T Huntington, P G Hartley, J Katsifolis
Ultramicroscopy|January 14, 2003
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beamW McBride, D J H Cockayne, K Tsuda
Ultramicroscopy|January 1, 1987
Angular reconstitution: a posteriori assignment of projection directions for 3D reconstructionM Van Heel
Ultramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M Malac
Ultramicroscopy|July 26, 2002
Field evaporation behaviour in the gamma phase in Ti-Al during analysis in the tomographic atom probeW Lefebvre, A Loiseau, A Menand
Ultramicroscopy|December 31, 2002
Reconstruction of composite in-line electron holograms using a small emission coneRoman Holenstein, Timothy A Rothwell, Mark R A Shegelski
Ultramicroscopy|December 31, 2002
Apertureless near-field optical microscopy of metallic nanoparticlesA Pack, W Grill, R Wannemacher
Ultramicroscopy|December 20, 2002
A modeling and convolution method to measure compositional variations in strained alloy quantum dotsP A Crozie, Massimo Catalano, R Cingolani
Ultramicroscopy|December 20, 2002
Thermal behaviour modelling of tapered optical fibres for scanning near-field microscopyL Thiery, N Marini
Pageof 475

Showing results (351-360 of 4,742) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|January 14, 2003
Holographic voltage profiling on 75 nm gate architecture CMOS devicesAlexander E Thesen, Bernhard G Frost, David C Joy
Ultramicroscopy|January 14, 2003
Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscopeS T Huntington, P G Hartley, J Katsifolis
Ultramicroscopy|January 14, 2003
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beamW McBride, D J H Cockayne, K Tsuda
Ultramicroscopy|January 1, 1987
Angular reconstitution: a posteriori assignment of projection directions for 3D reconstructionM Van Heel
Ultramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M Malac
Ultramicroscopy|July 26, 2002
Field evaporation behaviour in the gamma phase in Ti-Al during analysis in the tomographic atom probeW Lefebvre, A Loiseau, A Menand
Ultramicroscopy|December 31, 2002
Reconstruction of composite in-line electron holograms using a small emission coneRoman Holenstein, Timothy A Rothwell, Mark R A Shegelski
Ultramicroscopy|December 31, 2002
Apertureless near-field optical microscopy of metallic nanoparticlesA Pack, W Grill, R Wannemacher
Ultramicroscopy|December 20, 2002
A modeling and convolution method to measure compositional variations in strained alloy quantum dotsP A Crozie, Massimo Catalano, R Cingolani
Ultramicroscopy|December 20, 2002
Thermal behaviour modelling of tapered optical fibres for scanning near-field microscopyL Thiery, N Marini
Pageof 475