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Ultramicroscopy|December 20, 2002
A modeling and convolution method to measure compositional variations in strained alloy quantum dotsP A Crozie, Massimo Catalano, R CingolaniUltramicroscopy|December 20, 2002
Thermal behaviour modelling of tapered optical fibres for scanning near-field microscopyL Thiery, N MariniUltramicroscopy|December 21, 2002
Ferroelectric electron holographyHannes Lichte, Marianne Reibold, Karin Brand, et al.Ultramicroscopy|December 21, 2002
Synchrotron soft X-ray and field-emission electron sources: a comparisonJ C H Spence, M R HowellsUltramicroscopy|December 21, 2002
Low-energy foil aberration correctorR H van Aken, C W Hagen, J E Barth, et al.Ultramicroscopy|December 21, 2002
Aberration characteristics of immersion lenses for LVSEMAnjam KhursheedUltramicroscopy|September 8, 2001
X-ray spectral simulation and experimental detection of phosphorus segregation to grain boundaries in the presence of molybdenumA J Papworth, M Watanabe, D B WilliamsUltramicroscopy|July 1, 1993
Effect of probe force on the resolution of atomic force microscopy of DNAJ Yang, Z ShaoUltramicroscopy|June 1, 1995
PHOELIX: a package for semi-automated helical reconstructionM Whittaker, B O Carragher, R A MilliganPageof 460