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Ultramicroscopy|September 23, 2022
Line-rotated remapping for high-resolution electron backscatter diffractionYongzhe Wang, Nicolas Brodusch, Raynald Gauvin, et al.Ultramicroscopy|September 26, 2022
Data-driven dynamics-based optimal filtering of acoustic noise at arbitrary location in atomic force microscope imagingJiarong Chen, Qingze ZouUltramicroscopy|July 19, 2011
Assessment of local deformation using EBSD: quantification of accuracy of measurement and definition of local gradientMasayuki KamayaUltramicroscopy|June 14, 2011
Measurement of z-direction component of electron spins field-emitted from a single-crystal magnetite whiskerS Nagai, H Sakakibara, K Hata, et al.Ultramicroscopy|June 14, 2011
Detecting density variations and nanovoidsM K Miller, L Longstreth-Spoor, K F KeltonUltramicroscopy|June 14, 2011
Quantitative APT analysis of Ti(C,N)J Angseryd, F Liu, H-O Andrén, et al.Ultramicroscopy|July 12, 2011
Simulation of ion imaging: sputtering, contrast, noiseV Castaldo, C W Hagen, P KruitUltramicroscopy|July 12, 2011
Defocus and twofold astigmatism correction in HAADF-STEMM E Rudnaya, W Van den Broek, R M P Doornbos, et al.Ultramicroscopy|July 12, 2011
Local estimation of lattice constants in HRTEM imagesT Niermann, J B Park, M LehmannUltramicroscopy|July 12, 2011
Direct deformation study of AFM probe tips modified by hydrophobic alkylsilane self-assembled monolayersBernard Haochih Liu, Cheng-Hsien ChenPageof 460