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Ultramicroscopy|June 15, 2018
Analysis of electromagnetic forces and causality in electron microscopyAlejandro Reyes-Coronado, Carlos Gael Ortíz-Solano, Nerea Zabala, et al.
Ultramicroscopy|June 16, 2018
Towards bend-contour-free dislocation imaging via diffraction contrast STEMYuanyuan Zhu, Colin Ophus, Mychailo B Toloczko, et al.
Ultramicroscopy|July 14, 2018
Effect of cation ratio and order on magnetic circular dichroism in the double perovskite Sr2Fe1+xRe1-xO6Ping-Luen Ho, Chu-Ping Yu, Qiqi Zhang, et al.
Ultramicroscopy|June 24, 2018
Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and applicationVictor Boureau, Robert McLeod, Benjamin Mayall, et al.
Ultramicroscopy|April 21, 2019
Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessmentTomohito Tanaka, Angus J Wilkinson
Ultramicroscopy|April 22, 2019
Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscopeTakeshi Kawasaki, Tetsuya Akashi, Keigo Kasuya, et al.
Ultramicroscopy|April 22, 2019
CalAtom: A software for quantitatively analysing atomic columns in a transmission electron microscope imageQ Zhang, L Y Zhang, C H Jin, et al.
Ultramicroscopy|November 12, 2003
Optimized preparation of cross-sectional TEM specimens of organic thin filmsA C Dürr, F Schreiber, M Kelsch, et al.
Ultramicroscopy|November 12, 2003
Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4 Ga old zirconGelsomina De Stasio, Bradley H Frazer, Benjamin Gilbert, et al.
Ultramicroscopy|January 1, 1992
Detection, classification and 3D reconstruction of biological macromolecules on hypercube computersJ M Carazo, I Benavides, F F Rivera, et al.
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