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Ultramicroscopy|October 7, 2025
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloyTatiana Kormilina, Georg Haberfehlner, Thomas Mairhofer Radlinger, et al.
Ultramicroscopy|November 13, 2025
Reflected and transmitted secondary electron images of thin Si3N4 windowYanli Li, Yichen Ping, Yue Wu, et al.
Ultramicroscopy|October 5, 2025
Imaging domain boundaries of rubrene thin crystallites by photoemission electron microscopyMoha Naeimi, Katharina Engster, Waqas Pervez, et al.
Ultramicroscopy|July 18, 2025
Towards continuous time-dependent tomography: implementation and evaluation of continuous acquisition schemes in electron tomographyTimothy M Craig, Robin Girod, Gail Vinnacombe-Willson, et al.
Ultramicroscopy|January 9, 2026
STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectorsSylvain Laforet, Corentin Le Guillou, Adrien Teurtrie, et al.
Ultramicroscopy|December 16, 2025
A Fourier-optical approach for segmentation of ion microprobe images into tissue and non-tissue covered areasHarry J Whitlow, Rattanaporn Norarat, Robert J W Frost, et al.
Ultramicroscopy|May 21, 2025
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS mapsChristian Zietlow, Jörg K N Lindner
Ultramicroscopy|October 31, 2025
Bethe ridge electron Compton spectroscopyB G Mendis, S P Hayes, Cog Williamson, et al.
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