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Ultramicroscopy|December 4, 2025
On the Edge: In situ Kelvin probe AFM on InP nanowire arraysAustin Irish, Lukas Hrachowina, David Alcer, et al.
Ultramicroscopy|November 14, 2025
Femtosecond-laser-assisted focused ion beam method for the fabrication of tip specimens for atom probe tomographyYu-Chen Yang, Tung-Huan Chou, Ya-Lan Hsu, et al.
Ultramicroscopy|September 16, 2025
Substrate matters: Coupled phonon modes of a spherical particle on a substrate probed with EELSKa Yin Lee, Elliot K Beutler, Tifany Q Crisolo, et al.
Ultramicroscopy|October 25, 2025
Experimental study of energy-dependent angular broadening of MeV electron beams for high-resolution imaging in thick samplesXi Yang, Paul Denham, Atharva Kulkarni, et al.
Ultramicroscopy|August 3, 2025
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrastJanghyun Jo, Ivan Lazić, Eric G T Bosch, et al.
Ultramicroscopy|July 25, 2025
Large-angle convergent-beam electron diffraction patterns via conditional generative adversarial networksJoseph J Webb, Richard Beanland, Rudolf A Römer
Ultramicroscopy|December 3, 2013
An automated method of quantifying ferrite microstructures using electron backscatter diffraction (EBSD) dataSachin L Shrestha, Andrew J Breen, Patrick Trimby, et al.
Ultramicroscopy|September 4, 2013
A new method for the characterization of micro-/nano-periodic structures based on microscopic Moiré fringesDan Wu, Huimin Xie, Minjin Tang, et al.
Ultramicroscopy|May 17, 2013
Limits of simulation based high resolution EBSDJon Alkorta
Ultramicroscopy|April 9, 2013
Quantitative spin polarization analysis in photoelectron emission microscopy with an imaging spin filterChristian Tusche, Martin Ellguth, Alexander Krasyuk, et al.
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