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Ultramicroscopy|November 28, 2017
Dynamical scattering image simulations for two-phase γ-γ' microstructures: A theoretical modelS Singh, M J Mills, M De GraefUltramicroscopy|December 16, 2017
Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probeTakehiro Tachizaki, Toshihiko Nakata, Kaifeng Zhang, et al.Ultramicroscopy|December 18, 2017
Ion beam heating of kinetically constrained nanomaterialsXi Cen, Klaus van BenthemUltramicroscopy|December 22, 2017
Transmission scanning electron microscopy: Defect observations and image simulationsPatrick G Callahan, Jean-Charles Stinville, Eric R Yao, et al.Ultramicroscopy|November 29, 2017
An atomic force microscopy mode for nondestructive electromechanical studies and its application to diphenylalanine peptide nanotubesArseny Kalinin, Valentin Atepalikhin, Oleg Pakhomov, et al.Ultramicroscopy|October 24, 2017
Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopyI G C Weppelman, R J Moerland, J P Hoogenboom, et al.Ultramicroscopy|November 3, 2017
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositionsZhichao Zhong, Richard Aveyard, Bernd Rieger, et al.Ultramicroscopy|June 26, 2016
Oxygen octahedra picker: A software tool to extract quantitative information from STEM imagesYi Wang, Ute Salzberger, Wilfried Sigle, et al.Ultramicroscopy|September 2, 2017
On the use of SEM correlative tools for in situ mechanical testsQiwei Shi, Stéphane Roux, Félix Latourte, et al.Ultramicroscopy|September 2, 2017
Strain measurement of 3D structured nanodevices by EBSDWilliam Osborn, Lawrence H Friedman, Mark VaudinPageof 460