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Ultramicroscopy|December 6, 2024
Aberration calculation of microlens array using differential algebraic methodJintao Hu, Lei Yue, Yihao Ma, et al.Ultramicroscopy|December 13, 2023
The target region focused imaging method for scanning ion conductance microscopyShengbo Gu, Jian Zhuang, Tianying Wang, et al.Ultramicroscopy|April 6, 2024
Reflection imaging with a helium zone plate microscopeRanveig Flatabø, Sabrina D Eder, Thomas Reisinger, et al.Ultramicroscopy|March 19, 2024
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructuresEhsan Moradpur-Tari, Sergei Vlassov, Sven Oras, et al.Ultramicroscopy|September 28, 2024
On the temporal transfer function in STEM imaging from finite detector response timeJonathan J P Peters, Tiarnan Mullarkey, Julie Marie Bekkevold, et al.Ultramicroscopy|September 17, 2024
Maximizing the notional area in single tip field emittersSergey V Filippov, Fernando F Dall'Agnol, Eugeni O Popov, et al.Ultramicroscopy|September 21, 2024
Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopyCedric Shaskey, Amun Jarzembski, Andrew Jue, et al.Ultramicroscopy|February 22, 2024
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determinationD G Şentürk, A De Backer, S Van AertUltramicroscopy|February 24, 2024
Weld-free mounting of lamellae for electrical biasing operando TEMOscar Recalde-Benitez, Yevheniy Pivak, Tianshu Jiang, et al.Ultramicroscopy|February 15, 2024
Quantitative atomic cross section analysis by 4D-STEM and EELSShahar Seifer, Lothar Houben, Michael ElbaumPageof 460