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Ultramicroscopy|October 16, 2021
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findingsA Velazco, A Béché, D Jannis, et al.Ultramicroscopy|February 26, 2022
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanningStefan Manuel Noisternig, Christian Rentenberger, H Peter KarnthalerUltramicroscopy|January 1, 1987
Visibility and stability of a 12-tungsten atom complex in the scanning transmission electron microscopeK L Monson, J S Wall, J F HainfeldUltramicroscopy|April 8, 2023
Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplinesSpencer A Reisbick, Alexandre Pofelski, Myung-Geun Han, et al.Ultramicroscopy|January 1, 1986
Elemental imaging and resolution in energy-filtered conventional electron microscopyH Shuman, C F Chang, A P SomlyoUltramicroscopy|August 3, 2023
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion millingXiangchen Hu, Yuan Lu, Yu Chen, et al.Ultramicroscopy|August 10, 2023
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEMDamien Heimes, Varun Shankar Chejarla, Shamail Ahmed, et al.Ultramicroscopy|June 7, 2023
Single scan STEM-EMCD in 3-beam orientation using a quadruple apertureHasan Ali, Sharath Kumar Manjeshwar Sathyanath, Cheuk-Wai Tai, et al.Ultramicroscopy|November 17, 2023
Improving the temporal resolution of event-based electron detectors using neural network cluster analysisAlexander Schröder, Christopher Rathje, Leon van Velzen, et al.Ultramicroscopy|October 27, 2023
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kVKeita Kobayashi, Ryosuke KizuPageof 460