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Ultramicroscopy
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August 26, 2011
Quantitative magnetic force microscopy on permalloy dots using an iron filled carbon nanotube probe
F Wolny, Y Obukhov, T Mühl, et al.
Ultramicroscopy
|
June 14, 2011
REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns
J Barthel, A Thust
Ultramicroscopy
|
July 29, 2011
Minimization of amorphous layer in Ar+ ion milling for UHR-EM
M J Süess, E Mueller, R Wepf
Ultramicroscopy
|
December 15, 2010
Atom probe crystallography: characterization of grain boundary orientation relationships in nanocrystalline aluminium
Michael P Moody, Fengzai Tang, Baptiste Gault, et al.
Ultramicroscopy
|
December 15, 2010
Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation
L Yao, M P Moody, J M Cairney, et al.
Ultramicroscopy
|
December 15, 2010
Thermal stability of TiAlN/CrN multilayer coatings studied by atom probe tomography
Pyuck-Pa Choi, Ivan Povstugar, Jae-Pyeong Ahn, et al.
Ultramicroscopy
|
July 12, 2011
A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM
Lenard M Voortman, Sjoerd Stallinga, Remco H M Schoenmakers, et al.
Ultramicroscopy
|
July 12, 2011
Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in pseudoexfoliation syndrome
Rhiannon Creasey, Shiwani Sharma, Christopher T Gibson, et al.
Ultramicroscopy
|
July 12, 2011
A high signal-to-noise ratio toroidal electron spectrometer for the SEM
H Q Hoang, M Osterberg, A Khursheed
Ultramicroscopy
|
July 12, 2011
Spatially resolved diffractometry with atomic-column resolution
Koji Kimoto, Kazuo Ishizuka
Page
of 458
Search research articles
Search
Showing results (721-730 of 4,574) with videos related to
Sort By:
Page
of 458
Ultramicroscopy
|
August 26, 2011
Quantitative magnetic force microscopy on permalloy dots using an iron filled carbon nanotube probe
F Wolny, Y Obukhov, T Mühl, et al.
Ultramicroscopy
|
June 14, 2011
REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns
J Barthel, A Thust
Ultramicroscopy
|
July 29, 2011
Minimization of amorphous layer in Ar+ ion milling for UHR-EM
M J Süess, E Mueller, R Wepf
Ultramicroscopy
|
December 15, 2010
Atom probe crystallography: characterization of grain boundary orientation relationships in nanocrystalline aluminium
Michael P Moody, Fengzai Tang, Baptiste Gault, et al.
Ultramicroscopy
|
December 15, 2010
Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation
L Yao, M P Moody, J M Cairney, et al.
Ultramicroscopy
|
December 15, 2010
Thermal stability of TiAlN/CrN multilayer coatings studied by atom probe tomography
Pyuck-Pa Choi, Ivan Povstugar, Jae-Pyeong Ahn, et al.
Ultramicroscopy
|
July 12, 2011
A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM
Lenard M Voortman, Sjoerd Stallinga, Remco H M Schoenmakers, et al.
Ultramicroscopy
|
July 12, 2011
Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in pseudoexfoliation syndrome
Rhiannon Creasey, Shiwani Sharma, Christopher T Gibson, et al.
Ultramicroscopy
|
July 12, 2011
A high signal-to-noise ratio toroidal electron spectrometer for the SEM
H Q Hoang, M Osterberg, A Khursheed
Ultramicroscopy
|
July 12, 2011
Spatially resolved diffractometry with atomic-column resolution
Koji Kimoto, Kazuo Ishizuka
Page
of 458