Matteo Buffolo
4PUBLICATIONS
8CO-AUTHORS
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Publications (4)
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|May 05, 2021
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.Kalparupa Mukherjee, Carlo De Santi, Matteo Borga
|Apr 30, 2021
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p+n-n Diodes: The Road to Reliable Vertical MOSFETs.Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo
|Mar 06, 2021
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics.Matteo Buffolo, Alessandro Magri, Carlo De Santi
|Aug 30, 2018
Reliability of Blue-Emitting Eu2+-Doped Phosphors for Laser-Lighting Applications.Matteo Buffolo, Carlo De Santi, Marco Albertini
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