Matteo Meneghini
9PUBLICATIONS
15CO-AUTHORS
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Publications (9)
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|Aug 26, 2022
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode.Claudia Casu, Matteo Buffolo, Alessandro Caria
|May 05, 2021
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.Kalparupa Mukherjee, Carlo De Santi, Matteo Borga
|May 05, 2021
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation.Nicola Trivellin, Matteo Buffolo, Francesco Onelia
|Apr 30, 2021
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p+n-n Diodes: The Road to Reliable Vertical MOSFETs.Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo
|Mar 06, 2021
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics.Matteo Buffolo, Alessandro Magri, Carlo De Santi
|Oct 29, 2020
Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability.Kalparupa Mukherjee, Carlo De Santi, Matteo Borga
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Frequent Collaborators
7 joint publications
Gaudenzio Meneghesso
6 joint publications
Carlo De Santi
3 joint publications
Benoit Bakeroot
3 joint publications
Matteo Buffolo
2 joint publications
Sven Besendörfer
2 joint publications
Farid Medjdoub
1 joint publications
Feng Yu
1 joint publications
Elke Meissner
1 joint publications
Nicola Trivellin
1 joint publications
Francesco Onelia
