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Benoit Bakeroot

4PUBLICATIONS

8CO-AUTHORS

Electrical energy generation (incl. renewables, excl. photovoltaics)Engineering electromagnetics

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Publications (4)

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|May 05, 2021

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.

Kalparupa Mukherjee, Carlo De Santi, Matteo Borga

|Apr 30, 2021

Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p<sup>+</sup>n<sup>-</sup>n Diodes: The Road to Reliable Vertical MOSFETs.

Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo

|Mar 06, 2021

Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs.

Jie Wang, Zhanfei Chen, Shuzhen You

|Oct 29, 2020

Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability.

Kalparupa Mukherjee, Carlo De Santi, Matteo Borga

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Frequent Collaborators

3 joint publications

Carlo De Santi

3 joint publications

Gaudenzio Meneghesso

3 joint publications

Matteo Meneghini

2 joint publications

Matteo Buffolo

1 joint publications

Jie Wang

1 joint publications

Zhanfei Chen

1 joint publications

Matteo Borga

1 joint publications

Patrick Diehle

Frequent Collaborators

3 joint publications

Carlo De Santi

3 joint publications

Gaudenzio Meneghesso

3 joint publications

Matteo Meneghini

2 joint publications

Matteo Buffolo

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