Benoit Bakeroot
4PUBLICATIONS
8CO-AUTHORS
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Publications (4)
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|May 05, 2021
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.Kalparupa Mukherjee, Carlo De Santi, Matteo Borga
|Apr 30, 2021
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p+n-n Diodes: The Road to Reliable Vertical MOSFETs.Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo
|Mar 06, 2021
Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs.Jie Wang, Zhanfei Chen, Shuzhen You
|Oct 29, 2020
Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability.Kalparupa Mukherjee, Carlo De Santi, Matteo Borga
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