Lingling Ren
3PUBLICATIONS
10CO-AUTHORS
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Publications (3)
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|Jun 23, 2025
Metal-free high-contrast wafer-level step height standards with large height-range based on all-dielectric multilayers.Jinming Gou, Yuying Xie, Xiao Deng
|Feb 27, 2023
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.Tianjia Bu, Huifang Gao, Yaxuan Yao
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Frequent Collaborators
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Andrew J Pollard
1 joint publications
Alexandra Delvallée
1 joint publications
Sébastien Ducourtieux
1 joint publications
Bakir Babic
1 joint publications
Victoria A Coleman
1 joint publications
Zygmunt J Jakubek
1 joint publications
Xiao Deng
1 joint publications
Jingyuan Zhu
1 joint publications
Dongbai Xue
1 joint publications
Guiying Xu