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Davide G Sangiovanni, Kevin Kaufmann, Kenneth Vecchio
Kevin Kaufmann, Kenneth S Vecchio
Kevin Kaufmann, Chaoyi Zhu, Alexander S Rosengarten
Kevin Kaufmann, Chaoyi Zhu, Alexander S Rosengarten
Kevin Kaufmann, Chaoyi Zhu, Alexander S Rosengarten
Chaoyi Zhu, Kevin Kaufmann, Kenneth Vecchio

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
Published on : Jun 27, 2022

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on : May 10, 2021

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016