Video Experimental Relacionado

Updated: Jul 12, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Ciencia de los materiales. ciencia de los materiales. La búsqueda de semiconductores ferromagnéticos a temperatura

Koji Ando1

  • 1National Institute of Advanced Industrial Science and Technology (AIST), Nanoelectronics Research Institute, Umezono 1-1-1, Central 2, Tsukuba, Ibaraki 305-8568, Japan. ando-koji@aist.go.jp

Science (New York, N.Y.)
|July 1, 2006
PubMed
Resumen

No abstract available in PubMed .

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