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相关概念视频

UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Gas Chromatography: Types of Detectors-I01:21

Gas Chromatography: Types of Detectors-I

There are different types of detectors used in gas chromatography, each with its own specific properties that make it suitable for detecting certain types of analytes. The most commonly used detectors in GC are thermal conductivity detector (TCD), flame ionization detector (FID), and electron capture detector (ECD).
TCD is the earliest and most widely used detector that operates by measuring the changes in the thermal conductivity of the carrier gas. When a sample compound enters the detector,...
Gas Chromatography: Types of Detectors-II01:19

Gas Chromatography: Types of Detectors-II

In gas chromatography, different detectors are employed to meet specific analytical needs. These detectors are often categorized based on their detection mechanisms and the types of compounds they are best suited to analyze. Thermal Conductivity Detectors (TCD), Flame Ionization Detectors (FID), and Electron Capture Detectors (ECD) represent common categories, each with unique operating principles and applications. However, beyond these, several other detectors are designed for more specialized...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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在一个长波红外 HgCdTe Auger-抑制光二极管的缺陷分析.

Małgorzata Kopytko1, Kinga Majkowycz1, Krzysztof Murawski1

  • 1Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland.

Sensors (Basel, Switzerland)
|June 19, 2024
PubMed
概括
此摘要是机器生成的。

长波红外 (LWIR) HgCdTe光二极管的深层缺陷被使用深层瞬态光谱学 (DLTS) 和光发光学 (PL) 确定. 发现,空位 (VHg) 是这些LWIR装置中暗电流增加的主要原因.

关键词:
在 Auger 抑制下.DLTS DLTS是什么意思在 HgCdTe 的基础上.缺陷级别 缺陷级别 缺陷级别红外探测器 红外探测器摄影光的发光效应

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科学领域:

  • 半导体物理 半导体物理
  • 材料科学 材料科学 材料科学
  • 光电学是指光电子产品.

背景情况:

  • 在长波红外 (LWIR) 光二极管应用中,HgCdTe的异构结构至关重要.
  • 了解深层缺陷对于优化光二极管性能和减少暗电流至关重要.

研究的目的:

  • 为了描述LWIR HgCdTe光二极管的深层缺陷.
  • 为了确定导致暗电流增加的特定缺陷.
  • 为了确定这些缺陷的物理参数.

主要方法:

  • 金属有机化学蒸汽沉积 (MOCVD) 用于光电极制造.
  • 深层瞬态光谱 (DLTS) 用于缺陷能量水平和度测量.
  • 光发光 (PL) 光谱用于缺陷验证和能量水平的确定.

主要成果:

  • 确定了两个缺陷:一个电子陷 (252 meV) 和一个孔陷 (89 meV).
  • 被归因于空缺 (VHg) 的洞陷被发现是导致暗电流的主要原因.
  • 确定了VHg陷的特定参数:捕获截面 (σ = 10−164 × 10−15 cm2) 和度 (N = 34 × 1014 cm−3).

结论:

  • 水银空缺 (VHg) 是LWIR HgCdTe光二极管的一个重大缺陷.
  • VHg缺陷直接增加暗电流,影响设备性能.
  • 详细的表征提供了在未来的HgCdTe光二极管设计中减轻暗电流的关键数据.