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A position-sensitive ionization chamber for XAFS studies at synchrotron sources.

K Sato1

  • 1SPring-8/JASRI, Japan. kazusato@spring8.or.jp

Summary

A new position-sensitive ionization chamber offers sub-micrometer resolution for X-ray beam analysis. This advancement accurately measures beam position, crucial for understanding intensity variations and optimizing experimental setups.

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