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Updated: Jul 12, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Materials science. Seeking room-temperature ferromagnetic semiconductors
1National Institute of Advanced Industrial Science and Technology (AIST), Nanoelectronics Research Institute, Umezono 1-1-1, Central 2, Tsukuba, Ibaraki 305-8568, Japan. ando-koji@aist.go.jp
Summary
No abstract available in PubMed .
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