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Optical delay line for high time resolution measurement: W-type delay line.
Kyohei Hashimoto1, Satoru S Kano, Akihide Wada
1Molecular Photoscience Research Center, Kobe University, 1-1 Rokko-dai, Nada-ku, Kobe 657-8501, Japan.
The Review of Scientific Instruments
|December 3, 2008
Summary
A novel W-type optical delay line significantly enhances optical path length resolution, achieving sub-attosecond time resolution. This breakthrough surpasses conventional methods, offering an order of magnitude improvement for precise optical measurements.
Area of Science:
- Optics and Photonics
- Precision Measurement
Background:
- Conventional optical delay lines rely on mechanical translational stages.
- Existing methods face limitations in achieving high time resolution for optical path length measurements.
Purpose of the Study:
- To introduce and validate a new W-type optical delay line.
- To demonstrate superior time resolution compared to conventional translational stages.
Main Methods:
- Design and implementation of a novel W-type optical delay line.
- Interferometric measurements utilizing a diode laser and a conventional mechanical translational stage with 1 µm spatial resolution.
Main Results:
- The W-type delay line achieved an order of magnitude improvement in optical path length resolution.
- A time resolution of 16 attoseconds (as) was experimentally confirmed.
Conclusions:
- The W-type optical delay line offers a significant advancement in achieving high-resolution time measurements.
- This technology provides enhanced precision for applications requiring accurate optical path length control.
