Atomic Force Microscopy
MOSFET
Metal-Semiconductor Junctions
Switching of BJT
MOSFET: Enhancement Mode
Electro-mechanical Systems
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Updated: Jun 21, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Christian A Martin1, Roel H M Smit, Herre S J van der Zant
1Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands. martin@physics.leidenuniv.nl
Researchers created single-atom relays using electromechanical properties of gated mechanical break junctions. These devices allow reversible switching between atomic contacts and tunneling regimes, controlled by gate voltage.
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