Autocalibrated scanning-angle prism-type total internal reflection fluorescence microscopy for nanometer-precision

Wei Sun1, Kyle Marchuk, Gufeng Wang

  • 1Ames Laboratory-USDOE and Department of Chemistry, Iowa State University, Ames, Iowa 50011, USA.

Analytical Chemistry
|February 27, 2010
PubMed
Summary

A new total internal reflection fluorescence microscope (TIRFM) achieves sub-10 nm vertical resolution. This automated system precisely calibrates illumination and scans angles for advanced nanoscale imaging and material analysis.