Emissivity of microstructured silicon

Patrick G Maloney1, Peter Smith, Vernon King

  • 1U.S. Army Communications-Electronics Research, Development, and Engineering Center, Research, Development and Engineering Command, Night Vision and Electronic Sensors Directorate, Science and Technology Division, 10221 Burbeck Road Fort Belvoir, Virginia 22060, USA. info@nvl.army.mil

Applied Optics
|March 4, 2010
PubMed
Summary

Microstructured silicon surfaces exhibit tunable infrared emissivity, decreasing from 0.84 to 0.65 after measurement-induced annealing. This suggests potential applications in advanced optical and thermal management systems.