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Updated: Jun 10, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Spatial resolution of a hard x-ray CCD detector.
John F Seely1, Nino R Pereira, Bruce V Weber
1Space Science Division, Naval Research Laboratory, Washington, D.C. 20375, USA. john.seely@nrl.navy.mil
This study determined the spatial resolution of an x-ray CCD detector using tungsten x-ray lines. The detector
Area of Science:
- Medical Imaging
- Detector Physics
- Spectroscopy
Background:
- X-ray charge-coupled device (CCD) detectors are crucial for hard x-ray imaging.
- Accurate spatial resolution is essential for detailed spectral analysis.
- Characterizing detector performance is key to reliable scientific measurements.
Purpose of the Study:
- To precisely measure the spatial resolution of a 20-microm pixel x-ray CCD detector.
- To evaluate the detector's performance in the 58-70 keV energy range.
- To demonstrate methods for improving spectral resolution in hard x-ray detection.
Main Methods:
- Utilized a crystal spectrometer with a megavolt x-ray generator.
- Analyzed tungsten x-ray spectral lines focused onto the detector.
- Applied Fourier analysis to remove high spatial frequency background noise.
- Deconvolved Lorentzian line shapes to determine intrinsic spatial resolution.
Main Results:
- Determined the intrinsic spatial resolution of the x-ray CCD detector.
- Measured an average line width of 95 micrometers (4.75 pixels) after corrections.
- Successfully enhanced spectral resolution by processing spectral line features.
Conclusions:
- The study successfully characterized the spatial resolution of the x-ray CCD.
- Demonstrated effective techniques for improving spectral resolution in hard x-ray detection.
- Confirms the utility of CCD detectors with well-defined spatial resolution for hard x-ray spectroscopy.
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