Related Experiment Video
Updated: May 30, 2026

08:41
Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy
Published on: June 27, 2013
Experimental validation of atomic force microscopy-based cell elasticity measurements
1London Centre for Nanotechnology, University College London, London WC1H 0AH, UK.
Nanotechnology
|July 29, 2011
Summary
Atomic force microscopy (AFM) measurements of cell elasticity can be inaccurate. Pyramidal tips overestimate elasticity due to underestimated contact area, necessitating re-evaluation of published data.
Area of Science:
- Biophysics
- Cell Mechanics
- Microscopy
Background:
- Atomic force microscopy (AFM) is a common technique for measuring living cell elasticity.
- Reported AFM elasticity values vary widely (100 Pa–100 kPa) and differ from other methods.
- Tip geometry influences AFM elasticity measurements, with pyramidal tips yielding higher values than spherical tips.
Purpose of the Study:
- To investigate the accuracy of contact mechanics models used in AFM elasticity measurements.
- To directly measure the tip-cell contact area and indentation depth during AFM experiments.
- To identify sources of error in AFM-based cell elasticity measurements, particularly concerning tip geometry.
Main Methods:
- Combined Atomic Force Microscopy (AFM) and confocal microscopy were used.
- Epithelial cells expressing a GFP-tagged membrane marker were utilized.
- Experimentally measured indentation geometry and depth were compared with AFM force-indentation curve analyses.
Main Results:
- For spherical tips, the experimentally measured contact area closely matched predicted values.
- For pyramidal tips, contact area was significantly underestimated at forces >0.2 nN.
- This underestimation led to a >2-fold overestimation of cell elasticity when using pyramidal tips.
Conclusions:
- Standard AFM contact mechanics models may overestimate cell elasticity, especially with pyramidal tips.
- A re-examination of previously reported cellular elasticity values obtained via AFM may be required.
- Guidelines are proposed to mitigate measurement artifacts and improve the accuracy of AFM elasticity measurements.

