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Writing and Low-Temperature Characterization of Oxide Nanostructures
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Writing and Low-Temperature Characterization of Oxide Nanostructures

Published on: July 18, 2014

Emergent phenomena at oxide interfaces

H Y Hwang1, Y Iwasa, M Kawasaki

  • 1Correlated Electron Research Group, RIKEN-Advanced Science Institute, Saitama 351-0198, Japan. hyhwang@stanford.edu

Nature Materials
|January 25, 2012
PubMed

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