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Updated: May 22, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

Modeling of electron conduction in contact resistive random access memory devices as random telegraph noise

Yuan Heng Tseng, Wen Chao Shen, Chrong Jung Lin

    Journal of Applied Physics
    |April 27, 2012
    PubMed

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