Reflectometry based on a frequency-shifted interferometer using sideband interference
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Updated: May 12, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
1Center for Quantum Information and Quantum Control, University of Toronto, Toronto, Ontario, Canada. bing.qi@utoronto.ca
Abstract:
Frequency-shifted interferometry has shown great potential in optical fiber sensor multiplexing. In this letter, we propose and demonstrate a frequency-shifted interferometer (FSI) based on sideband interference. Comparing with previous implementation of FSI based on a Sagnac interferometer, this scheme is much simpler and compact. By scanning the driving frequency of a LiNbO3 phase modulator in the range of 4.5-5.5 GHz, we demonstrate a spatial resolution of 0.1 m, which is 50 times better than the previously reported results.
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