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3D Imaging of Soft-Tissue Samples using an X-ray Specific Staining Method and Nanoscopic Computed Tomography
Published on: October 24, 2019
Note: Portable total reflection X-ray fluorescence spectrometer with small vacuum chamber.
Shinsuke Kunimura1, Shunpei Kudo, Hiroki Nagai
1Department of Industrial Chemistry, Faculty of Engineering, Tokyo University of Science, Shinjuku-ku, Tokyo, Japan. kunimura@ci.kagu.tus.ac.jp
The Review of Scientific Instruments
|May 3, 2013
Summary
Performing total reflection X-ray fluorescence (TXRF) measurements in vacuum significantly reduces spectral background. This enhancement improves detection limits for portable X-ray fluorescence spectrometers, achieving 8 pg for Chromium.
Area of Science:
- Analytical Chemistry
- Materials Science
- Spectroscopy
Background:
- Portable X-ray fluorescence (TXRF) spectrometers are valuable for elemental analysis.
- Improving the detection limits of TXRF is crucial for sensitive elemental quantification.
- White X-rays from low-power sources present challenges in achieving low detection limits.
Purpose of the Study:
- To enhance the detection limits of a portable total reflection X-ray fluorescence (TXRF) spectrometer.
- To investigate the effect of performing TXRF measurements in a vacuum environment.
- To assess the performance improvement using white X-rays from a low-power X-ray tube.
Main Methods:
- Measurements were conducted using a portable TXRF spectrometer equipped with a 5 W X-ray tube emitting white X-rays.
- TXRF spectra were acquired both in air and in a vacuum environment.
- The spectral background and detection limits were compared between air and vacuum measurements.
Main Results:
- Performing TXRF measurements in vacuum significantly reduced spectral background compared to air measurements.
- The reduction in background scattering from air improved the signal-to-noise ratio.
- A detection limit of 8 picograms (pg) for Chromium (Cr) was achieved when measuring in vacuum.
Conclusions:
- Measuring TXRF in vacuum is an effective strategy to improve detection limits.
- Vacuum operation minimizes X-ray scattering from air, leading to a cleaner spectrum.
- This technique enhances the sensitivity of portable TXRF spectrometers for elemental analysis.
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