Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

Area of Science:

• Nanotechnology
• Atomic Force Microscopy
• Electrostatics

Background:

• Accurate measurement of electrostatic fields is crucial in various scientific and technological domains.
• Existing methods may face limitations in resolution or sensitivity for nanoscale electrostatic field mapping.

Purpose of the Study:

• To introduce and validate a new technique for measuring electrostatic fields using a charged nanoparticle.
• To demonstrate the potential of this method for high-resolution electrostatic field mapping.

Main Methods:

• A single 210-nm Teflon nanoparticle (sTNP) was attached to a silicon nitride atomic force microscope tip.
• The sTNP was charged via contact electrification, acting as a point charge probe.
• Measurements were performed adjacent to a parallel plate condenser with gold/titanium electrodes.

Main Results:

• The technique achieved a measurement resolution of 250 nm along the X-axis and 100 nm along the Z-axis.
• The minimum measurable electrostatic force was determined to be within 50 pN.
• The charged sTNP effectively mapped the electrostatic field of the parallel plate condenser.

Conclusions:

• This novel method provides a high-resolution and sensitive approach for electrostatic field measurements.
• The charged nanoparticle probe on an AFM tip represents a promising tool for nanoscale electrostatics research.