Multiplexed TEM Specimen Preparation and Analysis of Plasmonic Nanoparticles

Sean K Mulligan1, Jeffrey A Speir1, Ivan Razinkov1,2

  • 1The National Resource for Automated Molecular Microscopy, La Jolla, California, 92037, USA.

Summary

A new system enables rapid screening of hundreds of nanoparticle samples using automated transmission electron microscopy (TEM) and advanced image analysis for size and shape characterization.

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