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Microfocusing at the PG1 beamline at FLASH.
Siarhei Dziarzhytski1, Natalia Gerasimova2, Rene Goderich3
1DESY, Notkestrasse 85, 22067 Hamburg, Germany.
Journal of Synchrotron Radiation
|December 25, 2015
Summary
The Kirkpatrick-Baez (KB) mirror system at the FLASH free-electron laser achieves 4µm focusing for high-resolution spectroscopy. Advanced manipulators and alignment methods minimize aberrations for optimal performance.
Area of Science:
- X-ray optics and instrumentation
- Free-electron laser applications
- Spectroscopy
Background:
- The PG1 beamline at the soft X-ray/XUV free-electron laser in Hamburg (FLASH) requires precise focusing for advanced experiments.
- High-resolution spectroscopy, particularly vacuum-ultraviolet (VUV) Raman spectroscopy, demands tight aberration-free focal spots.
Purpose of the Study:
- To design and implement a Kirkpatrick-Baez (KB) refocusing mirror system for the PG1 beamline.
- To achieve a focal spot size of 4µm × 6µm full width at half-maximum (FWHM) on the sample.
- To ensure optimal performance and resolution of the VUV Raman spectrometer end-station.
Main Methods:
- Development of specialized fully motorized in-vacuum manipulators for KB mirror holders.
- Alignment of the KB optics using wavefront-sensing techniques.
- Analysis of ablative imprints to assess and minimize aberrations like astigmatism.
Main Results:
- Successful implementation of the KB refocusing mirror system at the FLASH PG1 beamline.
- Achieved tight aberration-free focusing down to 4µm × 6µm FWHM.
- Minimized aberrations, including astigmatism, to enhance spectral resolution.
Conclusions:
- The developed KB mirror system and alignment procedures effectively deliver the required microfocus spot size.
- The system enables unprecedented energy resolution for VUV spectroscopy at FLASH.
- This advancement supports high-resolution studies at soft X-ray/XUV free-electron laser facilities.

