Baseline correction of AFM force curves in the force-time representation

Area of Science:

• Materials Science
• Nanotechnology
• Physics

Background:

• Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging and force measurements.
• Accurate force data correction is crucial for reliable interpretation of AFM results.
• Existing methods for correcting AFM force curves can be cumbersome and may not address all artifacts simultaneously.

Purpose of the Study:

• To develop and present a novel method for the proper correction of force data acquired with an atomic force microscope (AFM).
• To demonstrate the effectiveness of the force-time representation for simultaneous correction of offset and slope in AFM force curves.
• To provide a more convenient and accurate approach to AFM force data processing.

Main Methods:

• Utilizing the force-time representation of AFM data.
• Calculating correction factors for offset (F₀) and slope (dF/dt) from a single force-time curve.
• Applying a linear correction (CLt = F₀ + dF/dt·t) to experimental force data across approach, delay, and retraction regions.

Main Results:

• The proposed method enables simultaneous correction of offset and slope for complete AFM force data sets.
• The force-time representation allows artifactual behavior to be expressed as a single, differentiable function of time.
• This new method outperforms commonly employed techniques for AFM force curve correction.

Conclusions:

• The force-time representation offers a convenient and accurate approach for processing AFM force data.
• The presented correction method enhances the reliability and interpretability of AFM measurements.
• This work highlights the advantages of time-domain analysis for refining AFM experimental outcomes.