Evaluation of noise limits to improve image processing in soft X-ray projection microscopy

Erdenetogtokh Jamsranjav1, Kenichi Kuge1, Atsushi Ito2

  • 1Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, Chiba, Japan.

Summary

This study enhances soft X-ray microscopy image correction by evaluating background noise effects. A new simulation method proposes an upper noise limit for effective chromosome imaging, improving resolution in noisy biological samples.