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Accuracy of Milled Titanium Frameworks Constructed with Direct Scanning and Splinted Impression Techniques
Direct model scanning (DMS) for milled titanium implant frameworks resulted in significantly smaller vertical microgaps compared to the splinted impression (SIM) technique. This finding highlights DMS as a superior method for achieving precise implant framework fit.
Area of Science:
- Dental materials science
- Biomaterials engineering
- Prosthodontics
Background:
- Accurate fit of implant-supported prostheses is crucial for long-term success.
- Vertical microgaps at the implant-framework interface can lead to bacterial leakage and complications.
- Traditional impression techniques may introduce inaccuracies in framework fabrication.
Purpose of the Study:
- To compare the vertical microgap of milled titanium implant frameworks fabricated using direct model scanning (DMS) versus splinted impression (SIM) techniques.
- To evaluate the precision of framework fit associated with different digital and conventional impression methods.
Main Methods:
- Three external hex implants were embedded in a resin model.
- Titanium frameworks were milled using both DMS and SIM techniques.
- Microcomputed tomography (CT) was used to scan implant-framework interfaces.
- Vertical microgaps were measured using one-screw and two-screw tests with CT analyzer software.
Main Results:
- The DMS group exhibited significantly smaller mean maximum vertical microgaps in both one-screw (13.25 μm vs 72.40 μm) and two-screw (10.5 μm vs 36.2 μm) tests compared to the SIM group (P < .0001 and P = .0002, respectively).
- Direct model scanning demonstrated superior accuracy in framework fabrication.
Conclusions:
- Milled titanium frameworks fabricated via direct model scanning of implants show a reduced vertical microgap.
- The DMS technique offers greater precision for implant framework fabrication compared to splinted impression methods.
- This improved precision may contribute to enhanced clinical outcomes and reduced risk of complications.
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