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Reflection Correction for High-Accuracy Transmittance Measurements on Filter Glasses.

K D Mielenz1, R Mavrodineanu1

  • 1Institute for Materials Research, National Bureau of Standards, Washington, D.C. 20234.

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|March 20, 2020
PubMed
Summary
This summary is machine-generated.

Multiple reflections in spectrophotometers cause measurement bias. A numerical correction method using tilted samples in polarized light effectively removes this bias for accurate transmittance measurements.

Keywords:
Correction for reflectionscorrectionhigh accuracyreflections, multiplespectrophotometrysystematic bias in spectrophotometrytransmittance

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Area of Science:

  • Optical physics
  • Spectrophotometry
  • Metrology

Background:

  • Spectrophotometers are crucial for measuring light transmittance.
  • Multiple reflections within the sample compartment introduce systematic bias.
  • Accurate transmittance measurements are vital for material characterization, especially for filter glasses.

Purpose of the Study:

  • To identify and quantify the systematic bias caused by multiple reflections in spectrophotometer sample compartments.
  • To develop and validate a numerical correction method to eliminate this bias.
  • To assess the magnitude and characteristics of the correction.

Main Methods:

  • Measurements were performed on filter glasses using a high-accuracy spectrophotometer.
  • Samples were tilted within the sample compartment.
  • Measurements were taken using polarized light to isolate reflection effects.
  • A numerical correction algorithm was applied based on these measurements.

Main Results:

  • Multiple reflections were confirmed as a source of systematic bias in transmittance measurements.
  • A numerical correction method was successfully developed and applied.
  • The correction magnitude was found to be on the order of several 10-4 transmittance units.
  • The correction was largely independent of light polarization but showed slight wavelength dependence.

Conclusions:

  • The developed numerical correction effectively removes systematic bias from spectrophotometer transmittance measurements.
  • This method enhances the accuracy of transmittance data for filter glasses.
  • The findings are crucial for high-precision optical measurements and material science applications.