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Updated: Dec 10, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Nanoelectromechanical Position-Sensitive Detector with Picometer Resolution
Miao-Hsuan Chien1, Johannes Steurer1, Pedram Sadeghi1
1Institute of Sensor and Actuator Systems, TU Wien, 1040 Vienna, Austria.
Abstract:
Subnanometer displacement detection lays the solid foundation for critical applications in modern metrology. In-plane displacement sensing, however, is mainly dominated by the detection of differential photocurrent signals from photodiodes, with resolution in the nanometer range. Here, we present an integrated nanoelectromechanical in-plane displacement sensor based on a nanoelectromechanical trampoline resonator. With a position resolution of 4 pm/ for a low laser power of 85 μW and a repeatability of 2 nm after five cycles of operation as well as good long-term stability, this new detection principle provides a reliable alternative for overcoming the current position detection limit in a wide variety of research and application fields.

