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Updated: Nov 17, 2025
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Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements
Published on: September 7, 2019
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Embracing Uncertainty: Modeling Uncertainty in EPMA-Part II
1Surface and Microanalysis Science, NIST, Gaithersburg, MD 20899, USA.
Summary
This study introduces a new framework for calculating uncertainty in electron excited X-ray microanalysis, applying it to the Pouchou and Pichoir Simplified Model (XPP) for matrix correction. It considers various parameters to improve measurement accuracy and design.
Area of Science:
- Analytical Chemistry
- Materials Science
- Physics
Background:
- Electron excited X-ray microanalysis is crucial for elemental analysis.
- Accurate quantification requires robust matrix correction methods.
- Understanding and quantifying measurement uncertainty is essential for reliable results.
Purpose of the Study:
- To present a new framework for computing uncertainty in electron excited X-ray microanalysis.
- To apply this framework to the Pouchou and Pichoir Simplified Model (XPP) for matrix correction.
- To explore the relationship between uncertainty calculation and measurement optimization.
Main Methods:
- Application of a novel uncertainty computation framework.
- Utilizing the Pouchou and Pichoir Simplified Model (XPP) for matrix correction.
- Analysis of influencing parameters including beam energy, take-off angle, mass absorption coefficient, and surface roughness.
Main Results:
- Demonstration of the framework's applicability to the XPP model.
- Identification of key parameters influencing uncertainty in matrix correction.
- Establishment of a basis for optimizing measurement accuracy through design.
Conclusions:
- The proposed framework provides a systematic approach to uncertainty computation in X-ray microanalysis.
- Accurate matrix correction is achievable by considering various influential parameters.
- Optimizing measurement design based on uncertainty analysis enhances overall accuracy.
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