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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Yao Guo1, Yan Sun1, Alvin Tang2
1School of Physics, Beijing Institute of Technology, Beijing, 100081 China.
This study reveals a capacitive field-effect at electrical contacts to 2D materials, impacting integrated circuits. Engineering these contacts can improve device performance and enhance artificial neural network capabilities.
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