Direct Detection of Low Abundance Genes of Single Point Mutation

Sourav Mishra1, Jinseong Jeon1, Jun-Kyu Kang2,3

  • 1Department of Chemistry, Pohang University of Science and Technology, 77 Cheongam-Ro, Nam-Gu, Pohang 37673, Republic of Korea.

Nano Letters
|October 21, 2021
PubMed
Summary

A novel atomic force microscopy (AFM) method directly detects KRAS G12D mutations in cell-free DNA (cfDNA). This highly sensitive and specific technique offers a promising advancement for noninvasive cancer diagnostics using circulating tumor DNA (ctDNA).