Nanoscale Force-Mapping-Based Quantification of Low-Abundance Methylated DNA

Woo Cheol Shim1, Sungwook Woo1, Joon Won Park1,2

  • 1Department of Chemistry, Pohang University of Science and Technology, 77 Cheongam-Ro, Nam-Gu, Pohang 37673, Republic of Korea.

Nano Letters
|January 26, 2022
PubMed
Summary

This study introduces a novel atomic force microscopy (AFM) method to quantify methylated DNA (methyl-CpG) without prior DNA treatment. This technique shows high accuracy for detecting low-abundance methylated DNA, crucial for early cancer diagnosis.