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Updated: Aug 17, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Comparative analysis of speckle-based single-pixel imaging using uniform and non-redundant optical phased arrays
Abstract:
An optical phased array (OPA) is a compact high-speed wavefront modulation device that is promising for next-generation optical sensing systems. In particular, speckle-based single-pixel imaging (SSPI) using OPA is an attractive scheme since precise tuning of optical phases is unnecessary. In this work, we present a comprehensive analysis of SSPI using an OPA with N phase shifters by comparing two classes of OPAs: uniformly spaced OPA (UOPA) and non-redundant OPA (NROPA). Through singular value decomposition analysis of the illumination patterns generated from the OPA, we clarify the theoretical limit of the imaging resolution for each case. As a result, the number of resolvable points can be as large as N 2-N+1 for the case of NROPA. This is in clear contrast to the case of UOPA, where the number of resolvable points can only be as large as 2N-1. Finally, imaging results of a test target are compared to study the impact of the array layout in OPA-based SSPI. Our work provides theoretical understanding of OPA-based SSPI and reveals the effectiveness of SSPI using NROPA.

