Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
David Galante-Sempere1, Jeffrey Torres-Clarke1, Javier Del Pino1
1Institute for Applied Microelectronics (IUMA), Universidad de Las Palmas de Gran Canaria, 35001 Las Palmas de Gran Canaria, Spain.
This study introduces a novel low-power low-noise amplifier (LNA) for 5G Ka-band applications. Utilizing the gm/ID methodology, it achieves excellent performance with minimal power consumption.
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